Ilias Zacharias and Theodore Antonakopoulos:
Programming and Read-back Processes on Phase-Change Materials during Surface Scanning
The Pan-Hellenic Conference on Electronics and Telecommunications
- PACET 2015, Ioannina, Greece, May 2015.
Abstract: Scanning probe methods, based
on micro-electromechanical (MEMS) devices, have been employed to store
data at ultrahigh densities (>Tbit/sq.in) with low power consumption.
The use of microscopic conductive tip in contact with phase-change
materials (PCM) is one such approach, with the aim to record data as
amorphous or crystalline marks on a sample medium down to the nanometer
scale. These applications rely on the reversible phase transition
property of PCM between amorphous and (poly)crystalline state. Writing
data is a complex process which involves electrical, thermal and phase-transition
phenomena that determine the final size and shape of the written mark.
Reading is based on the detection of the large difference between
electrical conductivities of the two states of the phase-change medium.
Towards a better understanding of these processes, numerical models,
based on finite element methods (FEM), have been developed to simulate
and analyze such a system. The objective of this paper is to present a
theoretical study based on computational calculations, in order to
predict the spatial distribution of amorphization during writing and
derive the basic waveform of the read-back signal.
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