A Versatile Platform for Characterization of Solid-State Memory Channels

The 18th International Conference on Digital Signal Processing (DSP2013), Santorini, Greece, 1-3 July 2013.

Abstract: This paper presents a versatile hardware platform designed for high performance characterization and testing of non-volatile memories. The platform is based on a reconfigurable hardware-software architecture with high degree of multi-domain testing and data acquisition capabilities. The platform constitutes a valuable tool for statistical characterization of the solid-state memory channel for new and emerging non-volatile memories with the goal to study the noise and interference sources that affect the reliability of these devices. We describe the architecture of the hardware test-bed and demonstrate its functionality with experimental results from phase-change memory and flash memory devices.

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